Keywords :
Binary decoder, combinational circuits, control logic, digital computer, error detection, integrated circuits, micro-program control, parity check, READ-ONLY memory.; Circuit faults; Circuit testing; Combinational circuits; Computer errors; Decoding; Error correction; Large scale integration; Logic design; Signal processing; Sorting; Binary decoder, combinational circuits, control logic, digital computer, error detection, integrated circuits, micro-program control, parity check, READ-ONLY memory.;