DocumentCode :
1107655
Title :
Circuit structure relations to redundancy and delay
Author :
Saldanha, Alexander ; Brayton, Robert K. ; Sangiovanni-Vincentelli, Alberto L.
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
Volume :
13
Issue :
7
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
875
Lastpage :
883
Abstract :
The existence of redundant stuck-faults in a logic circuit is potentially detrimental to high-speed operation, especially when there are false paths that are longer than the circuit delay. Keutzer, Malik, and Saldanha (KMS) in IEEE transactions of Computer Aided Design, vol. 10, no. 4, p. 427, April 1991 have proved that redundancy is not necessary to reduce delay by presenting an algorithm that derives an equivalent irredundant circuit from a given redundant circuit, with no increase in delay. The KMS algorithm consists of an iterative loop of timing analysis, gate duplications, and redundancy removal to successively eliminate long false paths. In this paper we resolve the main bottlenecks of the KMS algorithm by providing an efficient single-pass algorithm to simultaneously remove all long false paths from a given circuit. We achieve this by relating a circuit structure property based on path lengths to the testability (redundancy) and delay. The application of this algorithm to a variety of related logic synthesis problems is described
Keywords :
combinatorial circuits; delays; fault location; iterative methods; logic CAD; logic testing; redundancy; KMS algorithm; algorithm; circuit delay; circuit structure; circuit structure relations; delay; equivalent irredundant circuit; false paths; gate duplications; high-speed operation; iterative loop; logic circuit; logic circuit design; logic synthesis problems; long false paths; path lengths; redundancy removal; redundant circuit; redundant stuck-faults; single-pass algorithm; testability; timing analysis,; Algorithm design and analysis; Circuit faults; Circuit synthesis; Circuit testing; Delay; Iterative algorithms; Logic circuits; Logic testing; Redundancy; Timing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.293944
Filename :
293944
Link To Document :
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