• DocumentCode
    1107663
  • Title

    Computer-Aided Analysis of RFI Effects in Digital Integrated Circuits

  • Author

    Whalen, James J. ; Tront, Joseph G. ; Larson, Curtis E. ; Roe, James M.

  • Author_Institution
    Department of Electrical Engineering, State University at Buffalo, Amherst, NY 14226. (716)831-1835
  • Issue
    4
  • fYear
    1979
  • Firstpage
    291
  • Lastpage
    297
  • Abstract
    A computer-aided analysis procedure based upon a modified Ebers-Moli transistor model is used to predict RFI effects in bipolar integrated circuits (IC´s). The procedure is applied to a digital IC to determine the RF power levels that cause several EM susceptibility thresholds to be exceeded.
  • Keywords
    Bipolar integrated circuits; Computer aided analysis; Digital integrated circuits; Integrated circuit modeling; Radio frequency; Radiofrequency integrated circuits; Radiofrequency interference; SPICE; Skin; Voltage; Bipolar integrated circuits; RFI effects; computer-aided analysis procedure; modified Ebers-Moll transistor model;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.1979.303769
  • Filename
    4091302
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1107663