Title :
The case of AC stress in the hot-carrier effect
Author :
Chen, Kueing-long ; Saller, Steve ; Shah, Rajiv
Author_Institution :
Texas Instruments Incorporated, Dallas, Texas
fDate :
3/1/1986 12:00:00 AM
Abstract :
During ac hot-carrier stress, the direction of the transient current flow is demonstrated to be important in device degradation as well as the amount of substrate current generated in transient periods.
Keywords :
AC generators; Circuits; DC generators; Degradation; Hot carrier effects; Hot carriers; Impact ionization; Stress; Threshold voltage; Transconductance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22504
