• DocumentCode
    1107680
  • Title

    The case of AC stress in the hot-carrier effect

  • Author

    Chen, Kueing-long ; Saller, Steve ; Shah, Rajiv

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Texas
  • Volume
    33
  • Issue
    3
  • fYear
    1986
  • fDate
    3/1/1986 12:00:00 AM
  • Firstpage
    424
  • Lastpage
    426
  • Abstract
    During ac hot-carrier stress, the direction of the transient current flow is demonstrated to be important in device degradation as well as the amount of substrate current generated in transient periods.
  • Keywords
    AC generators; Circuits; DC generators; Degradation; Hot carrier effects; Hot carriers; Impact ionization; Stress; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22504
  • Filename
    1485721
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1107680