DocumentCode :
1107690
Title :
A time dependent hydrodynamic device simulator SNU-2D with new discretization scheme and algorithm
Author :
Choi, Woo-Sung ; Ahn, Jae-Gyung ; Park, Young-June ; Min, Hong-Shick ; Hwang, Chang-Gyu
Author_Institution :
Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
Volume :
13
Issue :
7
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
899
Lastpage :
908
Abstract :
A two-dimensional device simulator SNU-2D based on the hydrodynamic model is developed for the simulation and analysis of submicron devices. The simulator has the capacity for both self-consistent steady-state and transient-state simulation. To obtain better convergence and numerical stability, we adopt an improved discretization scheme for the carrier energy flux equation and a new strategy for the transient simulation. In steady-state simulation the new discretization scheme shows a considerable improvement in convergence rate and numerical accuracy compared with the existing schemes. A transient simulation study is carried out on a deep submicron n-MOSFET used in the sense amplifier of SRAM cells to investigate the gate-switching characteristic. It is found that the behavior of carrier temperature is quasi-static during the switching time even for very fast switching speed, while the behavior of impact ionization under transient mode deviates from that under dc mode as the switching speed increases
Keywords :
carrier density; hot carriers; insulated gate field effect transistors; reliability; semiconductor device models; time-domain synthesis; 2D device simulator; SNU-2D; SRAM cells; algorithm; carrier energy flux equation; carrier temperature; convergence; convergence rate; deep submicron n-MOSFET; discretization scheme; gate-switching characteristic; hot carrier reliability; hydrodynamic model; improved discretization scheme; numerical accuracy; numerical stability; quasi-static; self-consistent steady-state simulation; sense amplifier; submicron devices; time dependent hydrodynamic device simulator; transient-state simulation; Analytical models; Convergence of numerical methods; Equations; Hydrodynamics; Impact ionization; MOSFET circuits; Numerical stability; Random access memory; Steady-state; Temperature sensors;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.293947
Filename :
293947
Link To Document :
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