Title :
Cellular automata based deterministic self-test strategies for programmable data paths
Author :
Van Sas, Jos ; Catthoor, Francky ; De Man, Hugo
Author_Institution :
IMEC, Leuven, Belgium
fDate :
7/1/1994 12:00:00 AM
Abstract :
In this paper, novel and optimized test strategies are presented for the generation of a set of predetermined test vectors on chip to be used as part of a BIST strategy for complex programmable data paths. Starting from a set of faults and a corresponding set of test vectors that cover these faults, the corresponding self-test hardware is determined automatically. For this purpose, a cellular automaton has been made. The CAD tool CAST accomplishes the synthesis of the cellular automaton and the self-test control logic, and evaluates the solution obtained. Dedicated test strategies for 1-pattern tests on the one hand and 1- and 2-pattern tests on the other hand have been developed. These new optimized strategies guarantee a BIST implementation with 100% stuck-at and stuck-open/close fault coverage for all detectable faults. They have been applied to data paths as used in an industrial-size speech processing vocoder design, developed with the silicon compiler CATHEDRAL-II
Keywords :
VLSI; built-in self test; cellular automata; design for testability; fault location; integrated circuit testing; logic testing; BIST strategy; CAD tool; CAST; CATHEDRAL-II; VLSI; cellular automata; dedicated test strategies; deterministic self-test strategies; predetermined test vectors; programmable data paths; speech processing vocoder design; stimulus generation; stuck-at fault coverage; stuck-open/close fault coverage; Automata; Automatic control; Automatic testing; Built-in self-test; Fault detection; Hardware; Logic design; Process design; Speech processing; Vocoders;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
