A comprehensive analysis of multilayer channel waveguides

Author

Osman, Nabil ; Koshiba, Masanori ; Kaji, Ryosaku

Author_Institution

Dept. of Electron. Eng., Hokkaido Univ., Sapporo, Japan

Volume

12

Issue

5

fYear

1994

fDate

5/1/1994 12:00:00 AM

Firstpage

821

Lastpage

826

Abstract

Using a simple approach based on the scalar finite element method, propagation characteristics of multilayer channel waveguides are calculated. The effective index, modal field, confinement factor, far-field intensity pattern, and radiation angle of the far-field pattern (full width at half maximum intensity) for multilayer channel waveguides formed with multiple quantum well (MQW) materials and with the MQW materials replaced by a single homogeneous material with the root mean square value of the refractive indexes are compared. Numerical results confirm that the root-mean-square-value approximation, which has been widely used for planar MQW (two-dimensional) waveguides, is useful also for MQW channel (three-dimensional) waveguides with a large number of layers

Keywords

approximation theory; integrated optics; optical films; optical waveguide theory; refractive index; semiconductor quantum wells; MQW materials; comprehensive analysis; confinement factor; effective index; far-field intensity pattern; far-field pattern; full width at half maximum intensity; modal field; multilayer channel waveguides; multiple quantum well; planar MQW 2D waveguides; propagation characteristics; radiation angle; refractive indexes; root mean square value; root-mean-square-value approximation; scalar finite element method; single homogeneous material; Electromagnetic waveguides; Finite element methods; Nonhomogeneous media; Optical computing; Optical refraction; Optical waveguides; Planar waveguides; Quantum well devices; Refractive index; Root mean square;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.293974

Filename

293974