Title :
Comments, with reply, on `Characterization and modeling of mismatch in MOS transistors for precision analog design´
Author :
Conroy, C.S.G. ; Lane, W.A. ; Moran, M.A. ; Lakshmikumar, K.R. ; Copeland, M.A.
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll., Cork
fDate :
2/1/1988 12:00:00 AM
Abstract :
In a recently published paper by K.R. Lakshmikumar, et al. (see ibid, vol.SC-21, no.6, p.1057-66, 1986) the yield of a digital-to-analog converter (DAC) as a function of component matching is estimated analytically. Here, an assumption inherent to that derivation, namely that the DAC outputs are independent, is questioned and is demonstrated to be inconsistent with Monte-Carlo simulations. The reply of the authors of the original paper is also included
Keywords :
digital-analogue conversion; insulated gate field effect transistors; semiconductor device models; DAC outputs; MOS transistors; Monte-Carlo simulations; component matching; digital-to-analog converter; mismatch; modeling; precision analog design; Equations; Hysteresis; Independent component analysis; MOSFETs; Oscillators; RNA; Solid state circuits; Switching circuits; Threshold voltage; Trigger circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of