DocumentCode :
1108133
Title :
Comments, with reply, on `Characterization and modeling of mismatch in MOS transistors for precision analog design´
Author :
Conroy, C.S.G. ; Lane, W.A. ; Moran, M.A. ; Lakshmikumar, K.R. ; Copeland, M.A.
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll., Cork
Volume :
23
Issue :
1
fYear :
1988
fDate :
2/1/1988 12:00:00 AM
Firstpage :
294
Lastpage :
296
Abstract :
In a recently published paper by K.R. Lakshmikumar, et al. (see ibid, vol.SC-21, no.6, p.1057-66, 1986) the yield of a digital-to-analog converter (DAC) as a function of component matching is estimated analytically. Here, an assumption inherent to that derivation, namely that the DAC outputs are independent, is questioned and is demonstrated to be inconsistent with Monte-Carlo simulations. The reply of the authors of the original paper is also included
Keywords :
digital-analogue conversion; insulated gate field effect transistors; semiconductor device models; DAC outputs; MOS transistors; Monte-Carlo simulations; component matching; digital-to-analog converter; mismatch; modeling; precision analog design; Equations; Hysteresis; Independent component analysis; MOSFETs; Oscillators; RNA; Solid state circuits; Switching circuits; Threshold voltage; Trigger circuits;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.294
Filename :
294
Link To Document :
بازگشت