Title :
The delta-doped field-effect transistor (δFET)
Author :
Schubert, Erdmann F. ; Fischer, A. ; Ploog, Klaus
Author_Institution :
Max-Planck-Institut für Festkörperforschung, Stuttgart, Federal Republic of Germany
fDate :
5/1/1986 12:00:00 AM
Abstract :
A field-effect transistor (FET) using a two-dimensional electron gas (2DEG) as an electron channel is fabricated from GaAs grown by molecular-beam epitaxy. The doping profile of the field-effect transistor is described by the Dirac delta (δ) function. The subband structure of δ-doped GaAs is calculated. The characteristics of the δFET are a high concentration of the 2DEG, a high breakdown voltage of the Schottky contact, a narrow distance of the 2DEG from the gate, and a high transconductance. These properties are analyzed. Preliminary results for the extrinsic transconductance and for the transit frequency are obtained from δFET´s having nonoptimized structures.
Keywords :
Doping profiles; Electron mobility; Energy states; FETs; Gallium arsenide; HEMTs; Impurities; Molecular beam epitaxial growth; Potential well; Transconductance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22543