Title :
Analysis of leaky modes in deep-ridge waveguides using the compact 2D FDTD method
Author :
Lu, Q.Y. ; Guo, W.H. ; Byrne, D. ; Donegan, J.F.
Author_Institution :
Semicond. Photonics Group, Trinity Coll. Dublin, Dublin
Abstract :
The compact 2D finite difference time domain method combined with the uniaxial anisotropic perfectly-matched-layer (UPML) absorption boundary condition and the Padeacute approximation transform has been employed in a novel method to analyse leaky modes in deep-ridge semiconductor waveguides. Compared with frequency-domain mode solvers based on complex root searching, this method is easy to implement and can calculate the mode loss and the propagation constant separately and reliably.
Keywords :
finite difference time-domain analysis; ridge waveguides; semiconductor device noise; 2D FDTD method; Padeacute approximation transform; UPML absorption boundary condition; anisotropic perfectly-matched-layer; deep-ridge waveguide; finite difference time domain method; leaky mode analysis; mode loss; propagation constant; semiconductor waveguides;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2009.3489
