DocumentCode
1108346
Title
Improvement of universal pin photodetectors in 0.35μm SiGe BiCMOS technology
Author
Marchlewski, A. ; Zimmermann, H. ; Jonak-Auer, I. ; Meinhardt, G. ; Wachmann, E.
Author_Institution
Inst. of Electrodynamics, Vienna Univ. of Technol., Vienna
Volume
45
Issue
13
fYear
2009
Firstpage
705
Lastpage
706
Abstract
Universal pin photodiodes combine low capacitance with high bandwidth and high responsivity. A speed improvement is achieved for a pin finger photodiode in a high-speed 0.35 mum SiGe heterojunction bipolar transistor (HBT) BiCMOS technology. The cathode finger structure results in a high responsivity of 0.2 A/W (quantum efficiency 61 ) for 410 nm light and a bandwidth of 1253 MHz at a reverse bias voltage of 3 V. Owing to the thick low doped intrinsic epitaxial layer, high bandwidths and high dynamic quantum efficiencies result for a wide spectrum of optical wavelengths from ultraviolet and blue to red and near-infrared.
Keywords
BiCMOS integrated circuits; Ge-Si alloys; heterojunction bipolar transistors; high-speed integrated circuits; infrared spectra; integrated optoelectronics; p-i-n photodiodes; semiconductor epitaxial layers; semiconductor heterojunctions; ultraviolet spectra; BiCMOS technology; SiGe; bandwidth 1253 MHz; cathode finger structure; heterojunction bipolar transistor; high dynamic quantum efficiency; high-speed HBT; low capacitance; low doped intrinsic epitaxial layer; near-infrared spectrum; optical wavelength; size 0.35 m; ultraviolet spectrum; universal pin photodetector; voltage 3 V; wavelength 410 nm;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2009.0738
Filename
5117406
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