• DocumentCode
    1108346
  • Title

    Improvement of universal pin photodetectors in 0.35μm SiGe BiCMOS technology

  • Author

    Marchlewski, A. ; Zimmermann, H. ; Jonak-Auer, I. ; Meinhardt, G. ; Wachmann, E.

  • Author_Institution
    Inst. of Electrodynamics, Vienna Univ. of Technol., Vienna
  • Volume
    45
  • Issue
    13
  • fYear
    2009
  • Firstpage
    705
  • Lastpage
    706
  • Abstract
    Universal pin photodiodes combine low capacitance with high bandwidth and high responsivity. A speed improvement is achieved for a pin finger photodiode in a high-speed 0.35 mum SiGe heterojunction bipolar transistor (HBT) BiCMOS technology. The cathode finger structure results in a high responsivity of 0.2 A/W (quantum efficiency 61 ) for 410 nm light and a bandwidth of 1253 MHz at a reverse bias voltage of 3 V. Owing to the thick low doped intrinsic epitaxial layer, high bandwidths and high dynamic quantum efficiencies result for a wide spectrum of optical wavelengths from ultraviolet and blue to red and near-infrared.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; heterojunction bipolar transistors; high-speed integrated circuits; infrared spectra; integrated optoelectronics; p-i-n photodiodes; semiconductor epitaxial layers; semiconductor heterojunctions; ultraviolet spectra; BiCMOS technology; SiGe; bandwidth 1253 MHz; cathode finger structure; heterojunction bipolar transistor; high dynamic quantum efficiency; high-speed HBT; low capacitance; low doped intrinsic epitaxial layer; near-infrared spectrum; optical wavelength; size 0.35 m; ultraviolet spectrum; universal pin photodetector; voltage 3 V; wavelength 410 nm;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2009.0738
  • Filename
    5117406