• DocumentCode
    110842
  • Title

    Femtosecond Laser Direct Writing Assisted Nonequilibriumly Doped Silicon n+-p Photodiodes for Light Sensing

  • Author

    Ji-Hong Zhao ; Chun-Hao Li ; Qi-Dai Chen ; Hong-Bo Sun

  • Author_Institution
    State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun, China
  • Volume
    15
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    4259
  • Lastpage
    4263
  • Abstract
    Micronanostructured silicon surface is irradiated by femtosecond laser pulses at sulfur hexafluoride atmosphere (S-doped black silicon) and photodiodes are successfully fabricated based on this material. From the scanning electronic microscope and atomic force microscope images, the black silicon layer shows micro-nanocomplex structures (microcones covered with nanoparticles). The optoelectrical properties of n+-p junction are formed between S-doped micro-nanostructured silicon-layer and substrate after thermal annealing. For the n+-p photodiode, current-voltage characteristics at different incident light powers have been investigated. The responsivity for 800-nm wavelength is 0.69 A/W at -5 V reverse bias, which is close to that of the usual commercial Si p-i-n photodiode. The present devices are stable and well reproducible.
  • Keywords
    atomic force microscopy; elemental semiconductors; laser beam annealing; microfabrication; nanofabrication; nanoparticles; optical sensors; p-i-n photodiodes; photodetectors; silicon; S-doped black silicon; S-doped micronanostructured silicon-layer; Si; atomic force microscope imaging; black silicon layer; current-voltage characteristics; femtosecond laser direct writing assisted nonequilibriumly doping; femtosecond laser pulse; incident light power; light sensing; microcone; micronanocomplex structure; micronanostructured silicon surface; n±p junction; n+-p photodiode; nanoparticle; optoelectrical property; p-i-n photodiode; scanning electronic microscope; sulfur hexafluoride atmosphere; thermal annealing; voltage -5 V; wavelength 800 nm; Annealing; Photodiodes; Silicon; Sun; Surface topography; Ultrafast optics; Femtosecond laser; black silicon; micro-nanostructures; n+-p photodiode;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2015.2414953
  • Filename
    7064746