DocumentCode :
110842
Title :
Femtosecond Laser Direct Writing Assisted Nonequilibriumly Doped Silicon n+-p Photodiodes for Light Sensing
Author :
Ji-Hong Zhao ; Chun-Hao Li ; Qi-Dai Chen ; Hong-Bo Sun
Author_Institution :
State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun, China
Volume :
15
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
4259
Lastpage :
4263
Abstract :
Micronanostructured silicon surface is irradiated by femtosecond laser pulses at sulfur hexafluoride atmosphere (S-doped black silicon) and photodiodes are successfully fabricated based on this material. From the scanning electronic microscope and atomic force microscope images, the black silicon layer shows micro-nanocomplex structures (microcones covered with nanoparticles). The optoelectrical properties of n+-p junction are formed between S-doped micro-nanostructured silicon-layer and substrate after thermal annealing. For the n+-p photodiode, current-voltage characteristics at different incident light powers have been investigated. The responsivity for 800-nm wavelength is 0.69 A/W at -5 V reverse bias, which is close to that of the usual commercial Si p-i-n photodiode. The present devices are stable and well reproducible.
Keywords :
atomic force microscopy; elemental semiconductors; laser beam annealing; microfabrication; nanofabrication; nanoparticles; optical sensors; p-i-n photodiodes; photodetectors; silicon; S-doped black silicon; S-doped micronanostructured silicon-layer; Si; atomic force microscope imaging; black silicon layer; current-voltage characteristics; femtosecond laser direct writing assisted nonequilibriumly doping; femtosecond laser pulse; incident light power; light sensing; microcone; micronanocomplex structure; micronanostructured silicon surface; n±p junction; n+-p photodiode; nanoparticle; optoelectrical property; p-i-n photodiode; scanning electronic microscope; sulfur hexafluoride atmosphere; thermal annealing; voltage -5 V; wavelength 800 nm; Annealing; Photodiodes; Silicon; Sun; Surface topography; Ultrafast optics; Femtosecond laser; black silicon; micro-nanostructures; n+-p photodiode;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2015.2414953
Filename :
7064746
Link To Document :
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