• DocumentCode
    1108430
  • Title

    Integration of resonant-tunneling transistors and hot-electron transistors

  • Author

    Moise, Theodore S. ; Kao, Yung-Chung ; Seabaugh, Alan C. ; Taddiken, Albert H.

  • Author_Institution
    Central Res. Labs., Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    15
  • Issue
    7
  • fYear
    1994
  • fDate
    7/1/1994 12:00:00 AM
  • Firstpage
    254
  • Lastpage
    256
  • Abstract
    We have integrated a tunneling hot-electron transfer amplifier (THETA) and a novel resonant-tunneling hot-electron transfer amplifier (RTHETA) within a single epitaxial growth. At room temperature, the THETA exhibits a common-emitter current gain of greater than six and a voltage swing of 800 mV when measured in an inverter configuration. The RTHETA exhibits similar common-emitter current gain and a four-state voltage transfer characteristic with an output voltage swing of 1 V. In contrast to the resonant-tunneling hot-electron transistor (RHET), the RTHETA exhibits current gain both before and after the resonant peak voltage. From on-wafer S-parameter measurements, the current-gain cut-off frequency (f/sub T/) and the maximum frequency of oscillation f/sub max/) for both transistors are approximately 20 GHz and 9 GHz, respectively.<>
  • Keywords
    S-parameters; bipolar integrated circuits; hot electron transistors; integrated logic circuits; logic gates; molecular beam epitaxial growth; resonant tunnelling devices; 20 GHz; 800 mV; 9 GHz; common-emitter current gain; current-gain cut-off frequency; four-state voltage transfer characteristic; hot-electron transistors; inverter configuration; maximum frequency of oscillation; on-wafer S-parameter measurements; output voltage swing; resonant-tunneling hot-electron transfer amplifier; resonant-tunneling transistors; single epitaxial growth; tunneling hot-electron transfer amplifier; Current measurement; Cutoff frequency; Epitaxial growth; Gain measurement; Inverters; Resonance; Resonant tunneling devices; Scattering parameters; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.294087
  • Filename
    294087