DocumentCode :
1108430
Title :
Integration of resonant-tunneling transistors and hot-electron transistors
Author :
Moise, Theodore S. ; Kao, Yung-Chung ; Seabaugh, Alan C. ; Taddiken, Albert H.
Author_Institution :
Central Res. Labs., Texas Instrum. Inc., Dallas, TX, USA
Volume :
15
Issue :
7
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
254
Lastpage :
256
Abstract :
We have integrated a tunneling hot-electron transfer amplifier (THETA) and a novel resonant-tunneling hot-electron transfer amplifier (RTHETA) within a single epitaxial growth. At room temperature, the THETA exhibits a common-emitter current gain of greater than six and a voltage swing of 800 mV when measured in an inverter configuration. The RTHETA exhibits similar common-emitter current gain and a four-state voltage transfer characteristic with an output voltage swing of 1 V. In contrast to the resonant-tunneling hot-electron transistor (RHET), the RTHETA exhibits current gain both before and after the resonant peak voltage. From on-wafer S-parameter measurements, the current-gain cut-off frequency (f/sub T/) and the maximum frequency of oscillation f/sub max/) for both transistors are approximately 20 GHz and 9 GHz, respectively.<>
Keywords :
S-parameters; bipolar integrated circuits; hot electron transistors; integrated logic circuits; logic gates; molecular beam epitaxial growth; resonant tunnelling devices; 20 GHz; 800 mV; 9 GHz; common-emitter current gain; current-gain cut-off frequency; four-state voltage transfer characteristic; hot-electron transistors; inverter configuration; maximum frequency of oscillation; on-wafer S-parameter measurements; output voltage swing; resonant-tunneling hot-electron transfer amplifier; resonant-tunneling transistors; single epitaxial growth; tunneling hot-electron transfer amplifier; Current measurement; Cutoff frequency; Epitaxial growth; Gain measurement; Inverters; Resonance; Resonant tunneling devices; Scattering parameters; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.294087
Filename :
294087
Link To Document :
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