DocumentCode :
1108490
Title :
Effect of doping profile variations on the performance of the permeable base transistor
Author :
Gopinath, Anand ; Rankin, Bruce J.
Author_Institution :
MIT Lincoln Laboratory, Lexington, MA
Volume :
33
Issue :
6
fYear :
1986
fDate :
6/1/1986 12:00:00 AM
Firstpage :
816
Lastpage :
821
Abstract :
The cutoff frequency ftand maximum frequency of oscillation fmaxof the permeable-base transistor have been calculated for devices with a fixed geometry and different doping profiles to determine the profile that gave the highest value of f_{\\max } The effect of different static velocity-field curves for GaAs and InP, and associated diffusion-field dependencies on device performance have also been examined. The results of the simulations show that the saturated velocity for GaAs PBT\´s has a major impact on performance. The uniformly doped device, Ndof 4 × 1016cm-3, has a higher f_{\\max } when the saturated velocity is larger, but the effect of the low field mobility is small. The InP device has a slightly higher f_{\\max } than the corresponding GaAs devices at this doping level. The 20-10-4 × 1016cm-3devices have the highest f_{\\max } of all the GaAs devices investigated.
Keywords :
Cutoff frequency; Doping profiles; Electrodes; Finite element methods; Frequency estimation; Gallium arsenide; Geometry; Indium phosphide; Poisson equations; Semiconductor process modeling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1986.22574
Filename :
1485791
Link To Document :
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