DocumentCode :
1108546
Title :
A steady-state temperature model for silicon recrystallization using light sources
Author :
Kyung, Chong Min ; Yang, Y.Y.
Author_Institution :
Korea Advanced Institute of Science and Technology, Seoul, Korea
Volume :
33
Issue :
6
fYear :
1986
fDate :
6/1/1986 12:00:00 AM
Firstpage :
864
Lastpage :
865
Abstract :
A simplified, yet accurate enough temperature calculation scheme is proposed for SOI recrystallization using light sources. The assumption that the total amount of heat generated per unit area in the SOI wafer by the light absorption is balanced by the total outgoing radiation flux is shown to significantly reduce the CPU time to calculate the steady-state wafer temperature. The calculation results of this model have agreed fairly well with those of the rigorous and time-consuming Poisson solver (less than 3 K of temperature discrepancy for a typical case).
Keywords :
Absorption; Computational efficiency; Electron devices; Light sources; Semiconductor device modeling; Semiconductor films; Silicon; Steady-state; Temperature dependence; Thermal conductivity;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1986.22580
Filename :
1485797
Link To Document :
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