Title :
Introduction to the Special Issue on 2006 International Integrated Reliability Workshop (IIRW)
Author :
Chen, Yuanfeng ; Federspiel, Xavier ; Sullivan, Timothy ; Tao, G. ; Tonti, Bill ; Young, Cliff ; Zafar, Sameena
fDate :
6/1/2007 12:00:00 AM
Abstract :
The 14 invited papers in this special issue were selected from the International Integrated Reliability Workshop (IIRW), which was held on October 16-19, 2006 at the Stanford Sierra Camp on the shores of Fallen Leaf Lake near South Lake Tahoe, CA.
Keywords :
Conferences; Degradation; Electrostatic discharge; Human computer interaction; Lakes; Materials reliability; Semiconductor device reliability; Silicon on insulator technology; Special issues and sections; Stress;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2007.902085
