DocumentCode :
1108705
Title :
Advantages of metallic-amorphous-Silicon-gate FET´s in GaAs LSI applications
Author :
Suzuki, Masamitsu ; Murase, Katsumi ; Kato, Naoki ; Togashi, Minoru ; Hirayama, Masahiro
Author_Institution :
NTT Atsugi Electrical Communication Laboratories, Atsugi-shi, Japan
Volume :
33
Issue :
7
fYear :
1986
fDate :
7/1/1986 12:00:00 AM
Firstpage :
919
Lastpage :
924
Abstract :
A Schottky barrier as high as 1 V is obtained for contact between a ternary amorphous film, a-Si-Ge-B, and an n-type GaAs crystal. A metallic-amorphous-silicon-gate FET (MASFET) was made using the amorphous film as a gate contact. GaAs MASFET characteristics are superior to GaAs MESFET characteristics in application to LSI\´s with a DCFL configuration because the DCFL circuits with the GaAs MASFET\´s provide a logic level as high as 0.94 V and widen the circuit operation margin. Full operation is obtained from a 1 Kword × 2 bit SRAM with GaAs MASFET\´s, which is considered to be mainly due to the wide operation margin. The measured propagation delay time of the DCFL inverter is 34 ps at supply voltage V_{DD} = 1.5 V and power consumption of 1.9 mW/gate.
Keywords :
Amorphous materials; FETs; Gallium arsenide; Large scale integration; Logic circuits; MESFET circuits; Power measurement; Random access memory; Schottky barriers; Time measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1986.22595
Filename :
1485812
Link To Document :
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