DocumentCode
1108705
Title
Advantages of metallic-amorphous-Silicon-gate FET´s in GaAs LSI applications
Author
Suzuki, Masamitsu ; Murase, Katsumi ; Kato, Naoki ; Togashi, Minoru ; Hirayama, Masahiro
Author_Institution
NTT Atsugi Electrical Communication Laboratories, Atsugi-shi, Japan
Volume
33
Issue
7
fYear
1986
fDate
7/1/1986 12:00:00 AM
Firstpage
919
Lastpage
924
Abstract
A Schottky barrier as high as 1 V is obtained for contact between a ternary amorphous film, a-Si-Ge-B, and an n-type GaAs crystal. A metallic-amorphous-silicon-gate FET (MASFET) was made using the amorphous film as a gate contact. GaAs MASFET characteristics are superior to GaAs MESFET characteristics in application to LSI\´s with a DCFL configuration because the DCFL circuits with the GaAs MASFET\´s provide a logic level as high as 0.94 V and widen the circuit operation margin. Full operation is obtained from a 1 Kword × 2 bit SRAM with GaAs MASFET\´s, which is considered to be mainly due to the wide operation margin. The measured propagation delay time of the DCFL inverter is 34 ps at supply voltage
V and power consumption of 1.9 mW/gate.
V and power consumption of 1.9 mW/gate.Keywords
Amorphous materials; FETs; Gallium arsenide; Large scale integration; Logic circuits; MESFET circuits; Power measurement; Random access memory; Schottky barriers; Time measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22595
Filename
1485812
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