DocumentCode
1109035
Title
Analysis on electrostatic pattern yoke camera tubes
Author
Oku, Kentaro ; Fukushima, Masakazu
Author_Institution
Hitachi Ltd., Tokyo, Japan
Volume
33
Issue
8
fYear
1986
fDate
8/1/1986 12:00:00 AM
Firstpage
1090
Lastpage
1097
Abstract
To investigate the features of electron-beam systems in electrostatic deflecting camera tubes, a method for calculating the deflection field of the twisted curved-arrow pattern yoke is presented using the method of separation of variables. In spite of three-dimensional analysis, field values at 2000 points can be calculated at 10-3accuracy within 1 min using a HITAC-M200H computer. Distributions of deflection field also are given. Furthermore, deflection aberrations of electron beams are analyzed in the magnetic focusing and electrostatic deflecting (MS) systems. It is revealed that the favorable features of MS beam systems can be realized only by utilizing a nonuniform magnetic field. It is also seen that deflection aberrations and landing error are very dependent on a twist in the pattern yoke.
Keywords
Accuracy; Cameras; Electrodes; Electron beams; Electron tubes; Electrostatic analysis; Glass; Magnetic analysis; Magnetic fields; Pattern analysis;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22624
Filename
1485841
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