Title :
Inductor Current Zero-Crossing Detector and CCM/DCM Boundary Detector for Integrated High-Current Switched-Mode DC–DC Converters
Author_Institution :
STMicroelectron., Grenoble, France
Abstract :
This paper presents two circuits that allow us to accurately detect either the inductor current zero crossing, or the continuous/discontinous conduction modes boundary in the switched-mode dc-dc converters. Achieved detection accuracy allows us to improve the control and efficiency of the integrated high-output current converters, i.e., converters with low-resistance power switches. Detection is based on the voltage zero-cross detector, which provides ideally zero input-referred offset and very fast results. The concept of voltage polarity detector is based on the association of a dynamic current mirror and a simple autozero comparator. This paper describes the main concept of both circuits, aspects of the design allowing us to achieve high accuracy, and presents obtained results. Circuits´ performances are demonstrated on the integrated step-down dc-dc converter with IOUT = 2.5 A 30-mΩ NMOS power stage. Measured accuracy of the detection is in order of <;15 mA.
Keywords :
DC-DC power convertors; comparators (circuits); current mirrors; power inductors; switching convertors; CCM/DCM boundary detector; NMOS power stage; continuous conduction modes; current 2.5 A; discontinous conduction modes; dynamic current mirror; high-current switched-mode DC-DC converters; high-output current converters; inductor current zero-crossing detector; low-resistance power switches; resistance 30 mohm; simple autozero comparator; voltage polarity detector; voltage zero-cross detector; zero input-referred offset; Accuracy; Capacitors; Detectors; Inductors; MOS devices; Switches; Transistors; Autozero voltage polarity detector; autozero comparator; continuous/discontinous conduction modes (CCM/DCM) boundary detector; dc–dc converter; pulse-skipping mode; synchronous rectifier; zero-cross detector (ZCD);
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2013.2292600