Title :
Defects and processes in nonmetallic solids
Author_Institution :
Palo Alto Res. Center, CA, USA
fDate :
5/1/1986 12:00:00 AM
Keywords :
Book reviews; Semiconductor defects; Semiconductor impurities; Adaptive optics; Books; Charge carrier processes; Coherence; Lattices; Optical imaging; Optical interferometry; Semiconductor impurities; Solids; Speckle;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1986.1073029
