DocumentCode :
1109449
Title :
Brittle to Ductile Fracture Transition in Bulk Pb-Free Solders
Author :
Ratchev, Petar ; Vandevelde, Bart ; Verlinden, Bert ; Allaert, Bart ; Werkhoven, Daniel
Author_Institution :
Interuniv. Microelectron. Center, Leuven
Volume :
30
Issue :
3
fYear :
2007
Firstpage :
416
Lastpage :
423
Abstract :
The fracture toughness of bulk Sn, Sn-Cu, Sn-Ag, and Sn-Ag-Cu lead-free solders was measured as function of the temperature by means of a pendulum impact test (Charpy test). A ductile to brittle fracture transition was found, i.e., a sharp change in the fracture toughness. No transition was found for the eutectic Sn-Pb. The transition temperature of high purity Sn, Sn-0.5%Cu and Sn-0.5%Cu(Ni) alloys is around -125degC. The Ag-containing solders show a transition at higher temperatures: in the range of -78 to -45degC. The increase of the Ag content shifts the transition temperature towards higher values, which is related to the higher volume fraction of SnAg particles in the solder volume. At fixed volume fraction, smaller particle size shifts the transition temperature towards higher values. Therefore, a careful microstructure control is needed during the solder solidification after reflow in order to decrease the low temperature brittleness hazard.
Keywords :
eutectic alloys; fracture toughness; impact testing; particle size; silver alloys; solders; solidification; tin alloys; Charpy test; SnAg - Binary; SnAgCu - System; SnCu - Binary; brittle fracture; bulk solders; ductile fracture; fracture toughness; fracture transition; lead-free solders; low temperature brittleness hazard; microstructure control; particle size shifts; pendulum impact test; reflow process; solder solidification; transition temperature; Energy measurement; Environmentally friendly manufacturing techniques; Hazards; Lead; Microstructure; Performance evaluation; Temperature control; Temperature distribution; Testing; Tin; Pb-free solder; ductile to brittle fracture transition; pendulum impact (Charpy) test;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2007.901744
Filename :
4295163
Link To Document :
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