Title :
Charge-control analysis of the COMFET turn-off transient
Author :
Fossum, Jerry G. ; McDonald, Robert J.
Author_Institution :
University of Florida, Gainesville, FL
fDate :
9/1/1986 12:00:00 AM
Abstract :
A quasi-static charge-control analysis of the unique transient turn-off characteristic of the COMFET is developed. The analysis describes the transient behavior in terms of steady ON-state current components that flow in the constituent MOSFET and BJT in the basic COMFET structure. The effects of the expanding depletion region at the cathode and of minority-carrier injection into the anode are properly accounted for. Consequently, the physics underlying the turnoff time is clarified, and device design criteria for shortening it, without considerably degrading the ON-state current conduction capability, are suggested.
Keywords :
Anodes; Cathodes; Charge carrier processes; Conductivity; Degradation; FETs; MOSFET circuits; P-n junctions; Physics; Transient analysis;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22673