DocumentCode
1109554
Title
Planar, buried, ion-exchanged glass waveguides: Diffusion characteristics
Author
Ramaswamy, Ramu V. ; Najafi, S. Iraj
Author_Institution
Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
Volume
22
Issue
6
fYear
1986
fDate
6/1/1986 12:00:00 AM
Firstpage
883
Lastpage
891
Abstract
A detailed theoretical and experimental study of Ag+-Na+ exchange in soda-lime silicate glasses in a molten bath containing a mixture of NaNO3 and Ag+ is presented. With no applied field, concentration profiles
(and therefore, the index profiles for low concentrations) are given by complementary error function. The estimated value for the self-diffusion coefficient
of Ag+ is 0.133 μm2/min for low concentrations and it monotonically increases with the surface concentration C0 until it saturates at about 0.3 μm2/min for
MF. However, square root dependence of diffusion depth with time seems to be independent of the C0 . Presence of an external field
causes the effective depth of diffusion to increase. In fact, for large
fields, the profile can accurately be described by
where
where μ is the ionic mobility of Ag+in glass. We define a new diffusion depth
as the distance from the surface to the
concentration point, and for large fields,
varies linearly with
and
. Experimental results yielded a value of 15.55 μm2/
min forμ. As before, square root dependence of
with
and the linear variation of
versus C0 for
MF, with
saturating for
MF, were observed in the case of field assisted diffusion. A two-step process, where a surface waveguide formed in the first step with either
equal to zero or some finite value, is modified by performing a second diffusion in pure sodium nitrate to produce a buried, symmetrical fiber-like profile. This process is also studied in detail.
(and therefore, the index profiles for low concentrations) are given by complementary error function. The estimated value for the self-diffusion coefficient
of Ag+ is 0.133 μm2/min for low concentrations and it monotonically increases with the surface concentration C
MF. However, square root dependence of diffusion depth with time seems to be independent of the C
causes the effective depth of diffusion to increase. In fact, for large
fields, the profile can accurately be described by
where
where μ is the ionic mobility of Ag+in glass. We define a new diffusion depth
as the distance from the surface to the
concentration point, and for large fields,
varies linearly with
and
. Experimental results yielded a value of 15.55 μm2/
min forμ. As before, square root dependence of
with
and the linear variation of
versus C
MF, with
saturating for
MF, were observed in the case of field assisted diffusion. A two-step process, where a surface waveguide formed in the first step with either
equal to zero or some finite value, is modified by performing a second diffusion in pure sodium nitrate to produce a buried, symmetrical fiber-like profile. This process is also studied in detail.Keywords
Optical planar waveguides; Planar optical waveguide; Glass; Integrated optics; Optical device fabrication; Optical fibers; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Planar waveguides; Refractive index;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1986.1073050
Filename
1073050
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