• DocumentCode
    1110078
  • Title

    Scattering by a rectangularly corrugated surface: an approximate theory

  • Author

    Kriegsmann, Gregory A. ; Mccartin, Brian J.

  • Author_Institution
    New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    44
  • Issue
    8
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1193
  • Lastpage
    1194
  • Abstract
    We address the problem of the scattering of a plane, TM-polarized electromagnetic wave by a two-dimensional rectangularly corrugated surface. The height of the corrugation is measured by a characteristic length D and its period by Λ. We take the ordering of these scales to be D~Λ~λ where λ is the wavelength of the incident wave. We apply a radiation condition (strictly valid only in the far-field) in the aperture above a rectangular notch. This approximation allows the determination of an explicit representation of the reflection coefficients, the scattered field, and the field within a corrugation. Numerical results are presented which are in excellent agreement with a published finite difference approximation for diffraction gratings
  • Keywords
    approximation theory; diffraction gratings; electromagnetic fields; electromagnetic wave polarisation; electromagnetic wave reflection; electromagnetic wave scattering; 2D rectangularly corrugated surface; EM wave scattering; approximate theory; characteristic length; corrugation field; corrugation height; diffraction gratings; far field radiation; finite difference approximation; incident wave; period; periodic structures; plane TM-polarized electromagnetic wave; radiation condition; rectangularly corrugated surface; reflection coefficients; scattered field; wavelength; Apertures; Corrugated surfaces; Diffraction; Electromagnetic measurements; Electromagnetic scattering; Finite difference methods; Length measurement; Reflection; Surface waves; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.511829
  • Filename
    511829