DocumentCode
1110170
Title
Theory of the GaInAs/AlInAs-doped quantum well APD: A new low-noise solid-state photodetector for lightwave communication systems
Author
Brennan, Kevin
Author_Institution
Georgia Institute of Technology, Atlanta, GA
Volume
33
Issue
11
fYear
1986
fDate
11/1/1986 12:00:00 AM
Firstpage
1683
Lastpage
1695
Abstract
We present calculations of the electron and hole ionization coefficients, the excess noise factor, and gain for a doped quantum well APD made from the Al0.48 In0.52 As/Ga0.47 In0.53 As material systems. The ionization rates are calculated based on an ensemble Monte Carlo method. The effect of all of the device parameters, i.e., doping concentrations, layer widths, and the overall dc bias field, on the carrier ionization coefficients and the deterministic ionization probabilities,
and
, is determined. These results in conjunction with recent noise theory results are utilized to determine an optimal device design that provides high gain at very low noise. A complete design including number of stages and individual stage design is presented for the lowest noise, highest gain device realizable in this system. It is anticipated that this device can be used as a new ultralow-noise high-gain receiver in lightwave communications systems.
and
, is determined. These results in conjunction with recent noise theory results are utilized to determine an optimal device design that provides high gain at very low noise. A complete design including number of stages and individual stage design is presented for the lowest noise, highest gain device realizable in this system. It is anticipated that this device can be used as a new ultralow-noise high-gain receiver in lightwave communications systems.Keywords
Background noise; Communication systems; Doping; Ionization; Photodetectors; Quantum mechanics; Semiconductor device noise; Solid state circuits; Thermal loading; Thermal resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22729
Filename
1485946
Link To Document