Title :
Study of the quasi-saturation effect in VDMOS transistors
Author :
Darwish, Mohamed N.
Author_Institution :
AT&T Bell Laboratories, Reading, PA
fDate :
11/1/1986 12:00:00 AM
Abstract :
The quasi-saturation effect in VDMOS transistors is studied in detail. It is shown that such behavior is due to carrier velocity saturation in the JFET region of the device. Two-dimensional numerical simulation is carried out to study the quasi-saturation effect and its relation to different device design parameters. Experimental results over a wide range of voltage and current levels are used to verify calculated dc characteristics. In addition, the design constraint on p-body spacing in order to avoid the quasi-saturation effect is defined.
Keywords :
Dielectric devices; Difference equations; Finite difference methods; Impurities; Isolation technology; Numerical simulation; Poisson equations; Testing; Two dimensional displays; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22732