Title :
Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser
Author :
Puthukodan, S. ; Dadrasnia, E. ; Vinod, V.K.T. ; Nguendon, H.K. ; Lamela, H. ; Ducournau, Guillaume ; Lampin, Jean-Francois ; Garet, F. ; Coutaz, Jean-Louis ; Lee, Daw-Ming ; Baik, Seung-Kyu
Author_Institution :
GOTL, Univ. Carlos III de Madrid, Leganés, Spain
Abstract :
A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.
Keywords :
carbon nanotubes; dielectric thin films; electrical conductivity; permittivity; refractive index; terahertz wave spectra; C; Nicholson-Ross-Weir method; SiO2; complex permittivity; conductivity; deposition; electrical properties; frequency 220 GHz to 325 GHz; frequency 325 GHz to 500 GHz; fused quartz substrate; multiwalled carbon nanotube thin films; permittivity; refractive index; subTHz characterisation; vector network analyser;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2013.4136
