Title :
System Modeling and Testing Procedures for Microdiagnostics
Author :
Ramamoorthy, C.V. ; Chang, L.C.
Author_Institution :
Department of Electrical Engineering and Computer Science, University of California
Abstract :
Some basic ideas and practices in the area of microdiagnostics are surveyed, and these are molded into a theoretical framework that could help the design of microprogrammed computers, as well as the development of test procedures for fault detection and location. The basic architectural variations as seen in the current microprogrammed computers and their relationship to microdiagnostics are discussed.
Keywords :
Diagnostics, fault detection, fault location, microdiagnostics, microprogram.; Application software; Circuit faults; Computer aided manufacturing; Computer architecture; Fault detection; Fault location; Hardware; Microprogramming; Modeling; System testing; Diagnostics, fault detection, fault location, microdiagnostics, microprogram.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1972.223474
