DocumentCode :
1110504
Title :
Full-Wave Solver for Microstrip Trace and Through-Hole Via in Layered Media
Author :
Ong, Chong-Jin ; Wu, Boping ; Tsang, Leung ; Gu, Xiaoxiong
Author_Institution :
Micron Technol., Inc., Boise, ID
Volume :
31
Issue :
2
fYear :
2008
fDate :
5/1/2008 12:00:00 AM
Firstpage :
292
Lastpage :
302
Abstract :
This paper reports major improvements to a 3-D full wave solver for a microstrip line and through-hole via in layered media. The interior layer problem, consisting of vias between two reference planes, is solved using the Foldy-Lax multiple scattering equations. The exterior layer problem is solved using the method of moments (MoM) with the layered media Green´s functions. The exterior layer and interior layer problems are combined to obtain the S-parameters of the trace and through-hole via. A fast approach for calculating the layered-medium Green´s functions using the numerical modified steepest descent path method is utilized. The Green´s functions require milliseconds to compute per point. Schemes for efficiently computing image contributions for the static portion of the mixed potential Green´s function are also implemented to solve the neighboring or self-RWG (basis function) interaction in the MoM problem. To validate the accuracy of the solution, extensive comparison with Ansoft´s HFSS versions 9 and 11 for different pad sizes and antipad sizes are presented. The CPU per frequency is also tabulated to demonstrate the speed of the approach in this paper.
Keywords :
Green´s function methods; S-parameters; electromagnetic wave scattering; method of moments; microstrip lines; 3-D full wave solver; Ansoft HFSS; Foldy-Lax multiple equations; S-parameters; exterior layer problem; interior layer problem; layered media; layered media Green´s functions; method of moments; microstrip line; microstrip trace; steepest descent path method; through-hole; Electromagnetic analysis; interconnections; method of moments (MoM); nonhomogeneous media;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.920374
Filename :
4476032
Link To Document :
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