DocumentCode

1110826

Title

IVA-2 in situ mobility profiling of short channel field-effect transistors using the Hall current technique

Author

Andreou, A.G. ; Westgate, Charles R. ; Thoma

Volume

33

Issue

11

fYear

1986

fDate

11/1/1986 12:00:00 AM

Firstpage

1850

Lastpage

1850

Keywords

Computer science; Current measurement; FETs; Gallium arsenide; Geometry; Hall effect; Magnetic field measurement; Magnetic materials; Silicon; Transistors;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1986.22790

Filename

1486007