• DocumentCode
    1111059
  • Title

    VB-2 laser-induced photoemission for contactless high-speed IC testing

  • Author

    Blacha, A. ; Clauberg, R. ; Seitz, H.K. ; Beha, H.

  • Volume
    33
  • Issue
    11
  • fYear
    1986
  • fDate
    11/1/1986 12:00:00 AM
  • Firstpage
    1859
  • Lastpage
    1860
  • Keywords
    Circuit testing; Electrons; High speed integrated circuits; Integrated circuit testing; Optical pulses; Photoelectricity; Sampling methods; Semiconductor lasers; Spatial resolution; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22812
  • Filename
    1486029
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1111059