Title :
Wavelength detector using a pair of metal-semiconductor-metal photodetectors with subwavelength finger spacings
Author :
Chen, E. ; Chou, S.Y.
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fDate :
8/1/1996 12:00:00 AM
Abstract :
A wavelength detector that employs two metal-semiconductor-metal photodetectors with different subwavelength finger spacings is proposed and demonstrated. The resonance effect of the subwavelength-spaced fingers results in a photocurrent ratio that has one-to-one correspondence with the wavelengths of the monochromatic incident light. The device has a spectral range of 450-800 nm with a resolution of 5 nm. This device makes automatic wavelength calibration in optical instrumentation feasible
Keywords :
calibration; metal-semiconductor-metal structures; optical instruments; photodetectors; resonance; 450 to 800 nm; MSM photodetectors; automatic wavelength calibration; metal-semiconductor-metal photodetectors; optical instrumentation; resonance effect; subwavelength finger spacings; wavelength detector;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960964