DocumentCode
1111068
Title
Wavelength detector using a pair of metal-semiconductor-metal photodetectors with subwavelength finger spacings
Author
Chen, E. ; Chou, S.Y.
Author_Institution
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Volume
32
Issue
16
fYear
1996
fDate
8/1/1996 12:00:00 AM
Firstpage
1510
Lastpage
1511
Abstract
A wavelength detector that employs two metal-semiconductor-metal photodetectors with different subwavelength finger spacings is proposed and demonstrated. The resonance effect of the subwavelength-spaced fingers results in a photocurrent ratio that has one-to-one correspondence with the wavelengths of the monochromatic incident light. The device has a spectral range of 450-800 nm with a resolution of 5 nm. This device makes automatic wavelength calibration in optical instrumentation feasible
Keywords
calibration; metal-semiconductor-metal structures; optical instruments; photodetectors; resonance; 450 to 800 nm; MSM photodetectors; automatic wavelength calibration; metal-semiconductor-metal photodetectors; optical instrumentation; resonance effect; subwavelength finger spacings; wavelength detector;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19960964
Filename
511929
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