DocumentCode
1111140
Title
VB-7 prediction of hot-electron-induced gate currents
Author
Goldsman, N. ; Frey, Jesse
Volume
33
Issue
11
fYear
1986
fDate
11/1/1986 12:00:00 AM
Firstpage
1861
Lastpage
1861
Keywords
Boltzmann equation; Charge carrier processes; Current density; Distribution functions; Electrons; MOSFET circuits; Maxwell equations; Temperature; Testing; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22819
Filename
1486036
Link To Document