DocumentCode :
1111545
Title :
The Dual-Measurement Procedure for Eliminating Systematic Interference
Author :
Shen, Hao-Ming ; King, Ronold W.P. ; Wu, Tai T.
Author_Institution :
Gordon McKay Laboratory, Harvard University, Cambridge, MA 02138. (617) 495-4468
Issue :
1
fYear :
1984
Firstpage :
14
Lastpage :
18
Abstract :
A special "dual-measurement" procedure has been introduced for eliminating systematic interference in electromagnetic measurements. This interference has its origin in the same source as the measured signal and is usually picked up by the cables, chassis, and objects other than the sensor. The interference, when superimposed on the signal being measured, obscures the signal and degrades the accuracy of the measurement. The use of the dual-measurement procedure can notably reduce the systematic interference and greatly improve the clarity and accuracy of the measurement.
Keywords :
Degradation; EMP radiation effects; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Frequency; Impedance matching; Interference elimination; Pulse measurements; Wideband; EMP simulator; dual-measurement procedure; measurement accuracy; systematic interference mitigation;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.1984.304172
Filename :
4091700
Link To Document :
بازگشت