DocumentCode
1111545
Title
The Dual-Measurement Procedure for Eliminating Systematic Interference
Author
Shen, Hao-Ming ; King, Ronold W.P. ; Wu, Tai T.
Author_Institution
Gordon McKay Laboratory, Harvard University, Cambridge, MA 02138. (617) 495-4468
Issue
1
fYear
1984
Firstpage
14
Lastpage
18
Abstract
A special "dual-measurement" procedure has been introduced for eliminating systematic interference in electromagnetic measurements. This interference has its origin in the same source as the measured signal and is usually picked up by the cables, chassis, and objects other than the sensor. The interference, when superimposed on the signal being measured, obscures the signal and degrades the accuracy of the measurement. The use of the dual-measurement procedure can notably reduce the systematic interference and greatly improve the clarity and accuracy of the measurement.
Keywords
Degradation; EMP radiation effects; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Frequency; Impedance matching; Interference elimination; Pulse measurements; Wideband; EMP simulator; dual-measurement procedure; measurement accuracy; systematic interference mitigation;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.1984.304172
Filename
4091700
Link To Document