• DocumentCode
    1111545
  • Title

    The Dual-Measurement Procedure for Eliminating Systematic Interference

  • Author

    Shen, Hao-Ming ; King, Ronold W.P. ; Wu, Tai T.

  • Author_Institution
    Gordon McKay Laboratory, Harvard University, Cambridge, MA 02138. (617) 495-4468
  • Issue
    1
  • fYear
    1984
  • Firstpage
    14
  • Lastpage
    18
  • Abstract
    A special "dual-measurement" procedure has been introduced for eliminating systematic interference in electromagnetic measurements. This interference has its origin in the same source as the measured signal and is usually picked up by the cables, chassis, and objects other than the sensor. The interference, when superimposed on the signal being measured, obscures the signal and degrades the accuracy of the measurement. The use of the dual-measurement procedure can notably reduce the systematic interference and greatly improve the clarity and accuracy of the measurement.
  • Keywords
    Degradation; EMP radiation effects; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Frequency; Impedance matching; Interference elimination; Pulse measurements; Wideband; EMP simulator; dual-measurement procedure; measurement accuracy; systematic interference mitigation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.1984.304172
  • Filename
    4091700