DocumentCode :
1111578
Title :
Individual wire-length prediction with application to timing-driven placement
Author :
Qinghua Liu ; Bo Hu ; Marek-Sadowska, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
Volume :
12
Issue :
10
fYear :
2004
Firstpage :
1004
Lastpage :
1014
Abstract :
In this paper, we address the problem of individual wire-length prediction and demonstrate its usefulness in timing-driven placement. Many researchers have observed that different placement algorithms produce different individual wire lengths. We postulate that to obtain accurate results, individual wire-length prediction should be coupled with the placement flow. We embed the wire-length prediction into the clustering step of our fast placer implementation (FPI) framework . The predicted wire lengths act as constraints for the simulated annealing refinement stage, which guides the placement toward a solution fulfilling them. Experimental results show that our prediction process yields accurate results without loss of quality and incurs only a small cost in placement effort. We successfully apply the wire-length prediction technique to timing-driven placement. Our new slack assignment algorithm with predicted wire lengths (p-SLA) gives on average an 8% improvement in timing performance compared with the conventional modified zero-slack algorithm (m-ZSA).
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit modelling; simulated annealing; annealing refinement stage; clustering netlist; fast placer implementation; individual wire length prediction; integrated circuit interconnections; placement flow; simulated annealing; slack assignment algorithm; timing driven placement; Clustering algorithms; Costs; Delay; Integrated circuit interconnections; Lagrangian functions; Prediction algorithms; Predictive models; Simulated annealing; Timing; Wire;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2004.834234
Filename :
1336846
Link To Document :
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