• DocumentCode
    1111619
  • Title

    Phased-mission system reliability under Markov environment

  • Author

    Kim, Kuk ; Park, Kyung S.

  • Author_Institution
    Agency for Defense Dev., Daejeon, South Korea
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    301
  • Lastpage
    309
  • Abstract
    The authors show how to determine the reliability of a multi-phase mission system whose configuration changes during consecutive time periods, assuming failure and repair times of components are exponentially distributed and redundant components are repairable as long as the system is operational. The mission reliability is obtained for 3 cases, based on a Markov model. (1) Phase durations are deterministic; the computational compact set model is formulated and a programmable solution is developed using eigenvalues of reduced transition-rate matrices. (2) Phase durations are random variables of exponential distributions and the mission is required to be completed within a time limit; the solution is derived as a recursive formula, using the result of case 1 and mathematical treatment-a closed-form solution would be prohibitively complex and laborious to program. (3) Phase durations are random variables and there is no completion time requirement; the solution is derived similarly to case 1 using moment generating functions of phase durations. Generally, reliability problems of phased-mission systems are complex. The authors´ method provides exact solutions which can be easily implemented on a computer
  • Keywords
    Markov processes; eigenvalues and eigenfunctions; reliability; reliability theory; Markov environment; Markov model; closed-form solution; consecutive time periods; eigenvalues; exponentially distributed failure times; exponentially distributed repair times; phased-mission system reliability; programmable solution; reduced transition-rate matrices; Automation; Closed-form solution; Computational modeling; Eigenvalues and eigenfunctions; Failure analysis; Markov processes; Mathematical model; Military computing; Random variables; Reliability theory;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.295013
  • Filename
    295013