DocumentCode
1111619
Title
Phased-mission system reliability under Markov environment
Author
Kim, Kuk ; Park, Kyung S.
Author_Institution
Agency for Defense Dev., Daejeon, South Korea
Volume
43
Issue
2
fYear
1994
fDate
6/1/1994 12:00:00 AM
Firstpage
301
Lastpage
309
Abstract
The authors show how to determine the reliability of a multi-phase mission system whose configuration changes during consecutive time periods, assuming failure and repair times of components are exponentially distributed and redundant components are repairable as long as the system is operational. The mission reliability is obtained for 3 cases, based on a Markov model. (1) Phase durations are deterministic; the computational compact set model is formulated and a programmable solution is developed using eigenvalues of reduced transition-rate matrices. (2) Phase durations are random variables of exponential distributions and the mission is required to be completed within a time limit; the solution is derived as a recursive formula, using the result of case 1 and mathematical treatment-a closed-form solution would be prohibitively complex and laborious to program. (3) Phase durations are random variables and there is no completion time requirement; the solution is derived similarly to case 1 using moment generating functions of phase durations. Generally, reliability problems of phased-mission systems are complex. The authors´ method provides exact solutions which can be easily implemented on a computer
Keywords
Markov processes; eigenvalues and eigenfunctions; reliability; reliability theory; Markov environment; Markov model; closed-form solution; consecutive time periods; eigenvalues; exponentially distributed failure times; exponentially distributed repair times; phased-mission system reliability; programmable solution; reduced transition-rate matrices; Automation; Closed-form solution; Computational modeling; Eigenvalues and eigenfunctions; Failure analysis; Markov processes; Mathematical model; Military computing; Random variables; Reliability theory;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.295013
Filename
295013
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