• DocumentCode
    111176
  • Title

    Robust Hybrid Memristor-CMOS Memory: Modeling and Design

  • Author

    Mohammad, Baker ; Homouz, Dirar ; Elgabra, H.

  • Author_Institution
    Khalifa Univ., Abu Dhabi, United Arab Emirates
  • Volume
    21
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    2069
  • Lastpage
    2079
  • Abstract
    In this paper, we explore various aspects of memristor modeling and use them to propose improved access operations and design of a memristor-based memory. We study the current mathematical and SPICE modeling of memristors and compare them with known device specifications. Based on this survey of existing models, we adopt an improved mathematical model of the memristor that captures the well-established features of memristive devices. This modeling is used to analyze the time and voltage characteristics of stable read and write operations. The tradeoffs between the various design parameters such as voltage, frequency, noise margin, and area are also analyzed. Based on the device modeling, we propose a hybrid CMOS-memristor memory cell and architecture that addresses the limitations of memristor such as state drift, cell-cell interference, and refresh requirements. Memristor is used as a state element, and CMOS-based transistors are used to isolate, control, decode, and inter operate the logic. We verify our design using SPICE simulation using a 28-nm model for CMOS and a modified memristor model.
  • Keywords
    CMOS memory circuits; SPICE; adjacent channel interference; circuit simulation; memory architecture; memristors; semiconductor device models; CMOS-based transistors; SPICE modeling; SPICE simulation; access operations; cell-cell interference; device modeling; device specifications; hybrid CMOS-memristor memory cell; mathematical model; memory architecture; memristive devices; memristor modeling; memristor-based memory; read and write operations; refresh requirements; robust hybrid memristor-CMOS memory; state drift; time characteristic; voltage characteristic; Equations; Mathematical model; Memristors; Resistance; Semiconductor device modeling; Semiconductor process modeling; Switches; Emerging technology; low power; memristor; nonvolatile memory; semiconductor memory;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2227519
  • Filename
    6400279