Title :
Data pattern dependence of VCSEL far-field distributions
Author :
Al-Sowayan, S. ; Lear, K.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
The far field divergence angle distribution of vertical-cavity surface-emitting lasers is found to exhibit dependence on the data pattern driving the lasers. Two 50% duty cycle 1.25-Gb/s data patterns chosen to cause the same thermal conditions but with frequency content differing by a factor of 16 resulted in changes in the beam profile distributions with up to a 30% power variation in the central on-axis portion of the beam. Examination of the temporal waveforms as a function of far field angle revealed overshoot in the on-axis power and undershoot in the off-axis portion of the beam.
Keywords :
laser beams; laser cavity resonators; semiconductor lasers; surface emitting lasers; 1.25 Gbit/s; VCSEL; beam profile distributions; data pattern; far field divergence; far-field distributions; laser diode; temporal waveforms; vertical-cavity surface-emitting lasers; Bandwidth; Fiber lasers; Laser beams; Laser modes; Optical refraction; Optical surface waves; Optical transmitters; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.833925
