• DocumentCode
    1111995
  • Title

    Data pattern dependence of VCSEL far-field distributions

  • Author

    Al-Sowayan, S. ; Lear, K.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    16
  • Issue
    10
  • fYear
    2004
  • Firstpage
    2215
  • Lastpage
    2217
  • Abstract
    The far field divergence angle distribution of vertical-cavity surface-emitting lasers is found to exhibit dependence on the data pattern driving the lasers. Two 50% duty cycle 1.25-Gb/s data patterns chosen to cause the same thermal conditions but with frequency content differing by a factor of 16 resulted in changes in the beam profile distributions with up to a 30% power variation in the central on-axis portion of the beam. Examination of the temporal waveforms as a function of far field angle revealed overshoot in the on-axis power and undershoot in the off-axis portion of the beam.
  • Keywords
    laser beams; laser cavity resonators; semiconductor lasers; surface emitting lasers; 1.25 Gbit/s; VCSEL; beam profile distributions; data pattern; far field divergence; far-field distributions; laser diode; temporal waveforms; vertical-cavity surface-emitting lasers; Bandwidth; Fiber lasers; Laser beams; Laser modes; Optical refraction; Optical surface waves; Optical transmitters; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2004.833925
  • Filename
    1336881