DocumentCode :
1112588
Title :
Noise figure characteristics of 1/2-µm gate single-heterojunction high-electron-mobility FET´s at 35 GHz
Author :
Sovero, E.A. ; Gupta, Aditya K. ; Higgins, J.A.
Author_Institution :
Rockwell International Corporation, Thousand Oaks, CA
Volume :
7
Issue :
3
fYear :
1986
fDate :
3/1/1986 12:00:00 AM
Firstpage :
179
Lastpage :
181
Abstract :
In this letter, we report room-temperature noise figure performance of Gallium Arsenide single-heterojunction high-electron-mobility transistors (HEMT´s). We have measured a noise figure of 2 dB at 35 GHz with 5 dB of associated gain. The devices tested were 150 µm wide with 0.5-µm-long gates. The active layers were grown by molecular beam epitaxy (MBE). These values are the best reported results for either HEMT´s or MESFET´s at these frequencies, regardless of their geometry.
Keywords :
FETs; Gain measurement; Gallium arsenide; HEMTs; MESFETs; MODFETs; Molecular beam epitaxial growth; Noise figure; Noise measurement; Testing;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26336
Filename :
1486159
Link To Document :
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