• DocumentCode
    1112609
  • Title

    Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results

  • Author

    Du, Min-Wen ; Weiss, C.Dennis

  • Author_Institution
    College of Engineering, National Chiao Tung University
  • Issue
    3
  • fYear
    1973
  • fDate
    3/1/1973 12:00:00 AM
  • Firstpage
    235
  • Lastpage
    240
  • Abstract
    A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.
  • Keywords
    Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.; Circuit faults; Circuit testing; Combinational circuits; Computer networks; Computer science; Electrical fault detection; Fault detection; Fault trees; Intelligent networks; Logic; Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1973.223700
  • Filename
    1672293
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1112609