DocumentCode :
1112663
Title :
Integrated 3-D Magnetic sensor based on an n-p-n transistor
Author :
Kordic, S.
Author_Institution :
Delft University of Technology, Delft, The Netherlands
Volume :
7
Issue :
3
fYear :
1986
fDate :
3/1/1986 12:00:00 AM
Firstpage :
196
Lastpage :
198
Abstract :
A novel solid-state silicon sensor that is sensitive to all three components of the magnetic-field vector is presented. The sensor is based on the magnetotransistor principle and is fabricated in standard bipolar IC technology. The lateral part of the collector current has been used to sense the component of the magnetic field perpendicular to the surface of the chip, while the vertical part of the current has been used to measure the in-plane magnetic-field vector. The achieved spatial resolution of the measurement (8 × 10 × 20 µm) is dependent on the geometry of the active region of the device.
Keywords :
Bipolar integrated circuits; Current measurement; Hall effect devices; Magnetic devices; Magnetic field measurement; Magnetic sensors; Semiconductor device measurement; Silicon; Solid state circuits; Spatial resolution;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26342
Filename :
1486165
Link To Document :
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