Test Method for Measuring Bit Error Rate of Pulsed Transceivers in Presence of Narrowband Interferers

The popularity of pulse-based transceivers can be attributed to the high information rates that can be achieved in such systems compared to traditional narrowband systems. However, such systems are usually low-power and transmission efficiency is severely affected by the interference signals from other moderate to high-power narrowband transmitters. Hence, during manufacturing, pulse-based systems must be characterized and tested for bit error rate (BER) performance in the presence of narrowband interferers. Usually, at large interference levels, the BER is moderate (10^-4) to high (10^-2). However, at low interference levels when very few bits are in error, the BER is low (10^-6 - 10^-10 ) and testing for the BER becomes time consuming. We propose a new measurement technique employing sinusoidal pulses such that the BER value obtained is significantly large (10^-3 - 10^-4 ) even at low interference levels. BER values obtained using sinusoidal pulses are highly correlated to the actual BER values. Hence, the actual BER can be accurately estimated in a much smaller time without actually performing the standard test. This method was implemented in hardware using an Altera field-programmable gate-array development board. From the measurements, BER estimation error was less than 3%. In addition, significant reduction (up to 100 x) in test time was obtained using the proposed method.