Title :
Table of contents
Abstract :
The following topics are dealt with: integrated circuit reliability; digital nanometer circuits; software reliability; and fault trees.
Keywords :
digital integrated circuits; fault trees; integrated circuit reliability; nanotechnology; software reliability; digital nanometer cirucuits; fault trees; integrated circuit reliability; software reliability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2007.906781
