DocumentCode :
1112897
Title :
Feature Evalution with Measures of Probabilistic Dependence
Author :
Vilmansen, Toomas R.
Author_Institution :
Department of Electrical Engineering, University of British Columbia
Issue :
4
fYear :
1973
fDate :
4/1/1973 12:00:00 AM
Firstpage :
381
Lastpage :
388
Abstract :
In this paper, measures of probabilistic dependence are derived from distance measures and are applied to feature evaluation in pattern recognition. The main properties of the measures are derived and are discussed in their application to feature-class dependency. Relations between the measures and error probability are derived. Experiments using feature subsets extracted from Munson´s hand-printed data are performed to compare the feature-evaluating capabilities of the measures both relative to each other and relative to error probability.
Keywords :
Bhattacharyya dependence, error probability, feature evaluation, Joshi´s dependence, Kolmogorov dependence, Matusita´s dependence, measures of probabilistic dependence, mutual information, pattern recognition.; Data mining; Entropy; Error probability; Feature extraction; Multidimensional systems; Mutual information; Pattern recognition; Performance evaluation; Random variables; Bhattacharyya dependence, error probability, feature evaluation, Joshi´s dependence, Kolmogorov dependence, Matusita´s dependence, measures of probabilistic dependence, mutual information, pattern recognition.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1973.223725
Filename :
1672318
Link To Document :
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