Title :
Fault secure datapath synthesis using hybrid time and hardware redundancy
Author :
Wu, Kaijie ; Karri, Ramesh
Author_Institution :
Dept. of Electr. & Comput. Eng., Polytech. Univ., Brooklyn, NY, USA
Abstract :
A fault-secure datapath either generates a correct result or signals an error. This paper presents a register transfer level concurrent error detection (CED) technique that uses hybrid time and hardware redundancy to optimize the time and area overhead associated with fault security. The proposed technique combines the idle computation cycles in a datapath with selective breaking of data dependences of the normal computation. Designers can tradeoff time and hardware overhead by varying these design parameters. We present an algorithm to synthesize fault secure designs and validate it using Synopsys´ behavioral compiler.
Keywords :
circuit CAD; circuit optimisation; error detection; fault simulation; RT level synthesis; SEU; concurrent error detection; data dependence selective breaking; fault secure datapath synthesis; fault secure designs; fault security; hardware redundancy; hybrid time; idle computation cycles; register transfer level CED; single event upset; Circuit faults; Combinational circuits; Error analysis; Frequency; Hardware; Logic devices; Redundancy; Sequential circuits; Single event upset; Very large scale integration; CED; Concurrent error detection; RT; SEU; fault secure datapath; level synthesis; register transfer; single event upset;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2004.835132