DocumentCode :
1113046
Title :
A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures
Author :
Wang, Wen-Li ; Hemminger, Thomas L. ; Tang, Mei-Huei
Author_Institution :
Penn State Erie the Behrend Coll., Erie
Volume :
56
Issue :
3
fYear :
2007
Firstpage :
411
Lastpage :
421
Abstract :
We develop a moving average non-homogeneous Poisson process (MA NHPP) reliability model which includes the benefits of both time domain, and structure based approaches. This method overcomes the deficiency of existing NHPP techniques that fall short of addressing repair, and internal system structures simultaneously. Our solution adopts a MA approach to cover both methods, and is expected to improve reliability prediction. This paradigm allows software components to vary in nature, and can account for system structures due to its ability to integrate individual component reliabilities on an execution path. Component-level modeling supports sensitivity analysis to guide future upgrades, and updates. Moreover, the integration capability is a benefit for incremental software development, meaning only the affected portion needs to be re-evaluated instead of the entire package, facilitating software evolution to a higher extent than with other methods. Several experiments on different system scenarios and circumstances are discussed, indicating the usefulness of our approach.
Keywords :
moving average processes; reliability theory; sensitivity analysis; software reliability; stochastic processes; convolution; moving average nonhomogeneous Poisson process; reliability growth model; repair; sensitivity analysis; software reliability; system structures; Information science; Maximum likelihood estimation; Packaging; Probability density function; Programming; Sensitivity analysis; Software architecture; Software packages; Software reliability; Testing; Convolution; moving average non-homogeneous Poisson process; sensitivity analysis; software reliability; system structures;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2007.903119
Filename :
4298252
Link To Document :
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