Title :
A three-dimensional static RAM
Author :
Inoue, Y. ; Sugahara, K. ; Kusunoki, S. ; Nakaya, M. ; Nishimura, T. ; Horiba, Y. ; Akasaka, Y. ; Nakata, H.
Author_Institution :
Mitsubishi Electric Corporation, Itami, Japan
fDate :
5/1/1986 12:00:00 AM
Abstract :
A three-dimensional (3-D) 256-bit static random-access memory (RAM) with double active layers has been fabricated by using the laser recrystallization technique. Memory cells were located in a bottom active layer with an NMOS configuration and peripheral circuits were arranged in a top active layer with a CMOS configuration. Both active layers were connected by 112 via holes. The chip and cell sizes were 2.6 × 1.9 mm2and 50 × 70 µm2, respectively. The memory operation was observed with a supply voltage from 4 to 8 V. The shortest address access time of 42 ns was obtained at the supply voltage of 8 V.
Keywords :
CMOS memory circuits; Decoding; Large scale integration; MOS devices; Planarization; Random access memory; Read-write memory; Research and development; Silicon; Voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1986.26389