DocumentCode :
1113306
Title :
B73-12 Fault Detection in Digital Circuits
Author :
Su, S.Y.H.
Issue :
5
fYear :
1973
fDate :
5/1/1973 12:00:00 AM
Firstpage :
547
Lastpage :
547
Abstract :
Problems of testing switching networks have been with us since the first computer was built and have become more difficult as the technology moved from discrete components to integrated circuits. Consequently, there has been an increasing interest in this area. This book covers methods of deriving efficient tests for different classes of switching circuits.
Keywords :
Books; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Logic arrays; Logic testing; Sequential analysis; System testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1973.223766
Filename :
1672359
Link To Document :
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