DocumentCode :
1113336
Title :
Metal vapour densities in a pseudospark switch
Author :
Lins, G. ; Hartmann, W.
Author_Institution :
Corp. Res. & Dev., Siemens AG, Erlangen, Germany
Volume :
141
Issue :
2
fYear :
1994
fDate :
3/1/1994 12:00:00 AM
Firstpage :
148
Lastpage :
152
Abstract :
A pseudospark switch with a cathode made of a composite material containing 95% of tungsten and small amounts of iron, copper, and nickel was subjected to current pulses of 12 kA in amplitude and 1.6 μs duration. Laser-induced fluorescence was used to measure the contribution of each metal to the number density of neutral vapour released by the pseudospark discharge. The vapour composition differed considerably from the composition of the cathode material. In particular, the maximum copper vapour density amounted to 1.5 ×10 18 m-3 while the maximum tungsten density was as low as 2 ×1017 m-3. It is concluded that the loss of copper from the electrode material may result in disintegration of the electrode material after sufficient number of discharges. Hence low-melting additions to the cathodes of pseudospark switches should be avoided. A comparison of the ratios of the vapour densities of the constituents of the cathode material with the corresponding ratios of the equilibrium vapour pressures revealed that there are regions of extremely high (T>5000 K) and comparatively low (T≈1500 K) temperature on the cathode. This adds evidence to the view that the electron emission at the cathode of pseudosparks occurs from individual microscopic emission sites rather than from a surface heated homogeneously to a uniform temperature
Keywords :
cathodes; copper alloys; density of gases; iron alloys; nickel alloys; pulsed power technology; spark gaps; switches; tungsten alloys; 1.6 mus; 12 kA; 1500 K; 5000 K; WFeCuNi; cathode material; composite material; disintegration; electron emission; equilibrium vapour pressures; laser-induced fluorescence; low-melting additions; metal vapour densities; microscopic emission sites; pseudospark switch;
fLanguage :
English
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2344
Type :
jour
DOI :
10.1049/ip-smt:19949921
Filename :
295414
Link To Document :
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