Abstract :
Two algorithms are presented for the detection and location of single or multiple stuck faults in a fan-out free combinational circuit. The algorithms are based on a canonic representation of the indistinguishability classes of faults. The number of tests required in these algorithms are shown to be a linear function of the number of gates in the circuit.
Keywords :
Combinational circuits, fan-out free circuits, fault detection, fault diagnosis, fault location, multiple stuck faults, tree circuits.; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Fault location; Logic arrays; Telecommunications; Combinational circuits, fan-out free circuits, fault detection, fault diagnosis, fault location, multiple stuck faults, tree circuits.;
